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Volumn 24, Issue 6, 1977, Pages 757-761

A Two-Layer Microwave FET Structure for Improved Characteristics

Author keywords

[No Author keywords available]

Indexed keywords

TRANSISTORS, FIELD EFFECT;

EID: 0017503261     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1977.18817     Document Type: Article
Times cited : (15)

References (10)
  • 1
    • 0015629808 scopus 로고
    • Si and GaAs 0.5 μm-gate Schottky-barrier field-effect transistors
    • W. Baechtold et al, “Si and GaAs 0.5 μm-gate Schottky-barrier field-effect transistors,” Electron. Lett., vol. 9, pp. 232-234, 1973.
    • (1973) Electron. Lett. , vol.9 , pp. 232-234
    • Baechtold, W.1
  • 3
    • 0014863545 scopus 로고
    • Voltage-current characteristics of GaAs J-FET's in the hot electron range
    • K. Lehovec and R. Zuleeg, “Voltage-current characteristics of GaAs J-FET's in the hot electron range,” Solid-State Electron., vol. 13, pp. 1415-1426, 1970.
    • (1970) Solid-State Electron. , vol.13 , pp. 1415-1426
    • Lehovec, K.1    Zuleeg, R.2
  • 4
    • 0015346425 scopus 로고
    • Noise behavior GaAs field-effect transistors with short gate lengths
    • W. Baechtold, “Noise behavior GaAs field-effect transistors with short gate lengths,” IEEE Trans. Electron Devices, vol. ED-19, pp. 674-680,1972.
    • (1972) IEEE Trans. Electron Devices , vol.ED-19 , pp. 674-680
    • Baechtold, W.1
  • 5
    • 0016100806 scopus 로고
    • Noise characteristics of gallium arsenide field-effect transistors
    • H. Statz, H. A. Haus, and R. A. Pucel, “Noise characteristics of gallium arsenide field-effect transistors,” IEEE Trans. Electron Devices, vol. ED-21, pp. 549-562,1974.
    • (1974) IEEE Trans. Electron Devices , vol.ED-21 , pp. 549-562
    • Statz, H.1    Haus, H.A.2    Pucel, R.A.3
  • 6
    • 0016510228 scopus 로고
    • Field distribution in junction field-effect transistors at large drain voltages
    • K. Lehovec and R. S. Miller, “Field distribution in junction field-effect transistors at large drain voltages,” IEEE Trans. Electron Devices, vol. ED-12, pp. 273-281,1975.
    • (1975) IEEE Trans. Electron Devices , vol.ED-12 , pp. 273-281
    • Lehovec, K.1    Miller, R.S.2
  • 7
    • 0005280387 scopus 로고
    • Field-dependent mobility analysis of the field-effect transistor
    • F. N. Trofimenkoff, “Field-dependent mobility analysis of the field-effect transistor,” Proc. IEEE, vol. 53, pp. 1765-1766,1965.
    • (1965) Proc. IEEE , vol.53 , pp. 1765-1766
    • Trofimenkoff, F.N.1
  • 8
    • 84939329135 scopus 로고
    • GaAs Mes FET with two-layer channel
    • Grenoble
    • H. Beneking et al, “GaAs Mes FET with two-layer channel,” paper presented at ESSDERC, Grenoble, 1975.
    • (1975) paper presented at ESSDERC
    • Beneking, H.1
  • 9
    • 0015662412 scopus 로고
    • High-frequency limitations of abrupt-junction FET's
    • M. B. Das and P. Schmidt, “High-frequency limitations of abrupt-junction FET's,” IEEE Trans. Electron Devices, vol. ED-20, pp. 779-792,1973.
    • (1973) IEEE Trans. Electron Devices , vol.ED-20 , pp. 779-792
    • Das, M.B.1    Schmidt, P.2
  • 10
    • 0015200693 scopus 로고
    • Characteristics of the junction-gate field-effect transistor with short channel length
    • T. L. Chiu and H. N. Ghosh, “Characteristics of the junction-gate field-effect transistor with short channel length,” Solid-State Electron., vol. 14, pp. 1307-1317, 1971.
    • (1971) Solid-State Electron. , vol.14 , pp. 1307-1317
    • Chiu, T.L.1    Ghosh, H.N.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.