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Ultramicroscopy

Volumn 2, Issue C, 1976, Pages 207-217

Factors affecting high resolution fixed-beam transmission electron microscopy

(2) Chiu, Wah a Glaeser, R M a

a UNIVERSITY OF CALIFORNIA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MICROSCOPES, ELECTRON;

ELECTRON MICROSCOPY; METHODOLOGY;

MICROSCOPY, ELECTRON; MODELS, THEORETICAL; PHOTOMICROGRAPHY; SUPPORT, U.S. GOV'T, NON-P.H.S.; SUPPORT, U.S. GOV'T, P.H.S.;

EID: 0017477297 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/S0304-3991(76)91334-6 Document Type: Article

Times cited : (15)

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