Nonparametric Bayes Risk Estimation for Pattern Classification

IEEE Transactions on Systems, Man and Cybernetics

Volumn 7, Issue 9, 1977, Pages 651-656

  Chen, Zen ^a   Fu, King Sun ^b  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PROBABILITY;

PATTERN RECOGNITION SYSTEMS;

CLASSIFICATION; PATTERN RECOGNITION; STATISTICS;

EID: 0017368047     PISSN: 00189472     EISSN: 21682909     Source Type: Journal    
DOI: 10.1109/TSMC.1977.4309802     Document Type: Article

References (21)

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