On the Possible Orderings in the Measurement Selection Problem

IEEE Transactions on Systems, Man and Cybernetics

Volumn 7, Issue 9, 1977, Pages 657-661

  Cover, Thomas M ^a   Campenhout, Jan M Van ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PATTERN RECOGNITION SYSTEMS; PROBABILITY;

MEASUREMENT THEORY;

CLASSIFICATION; STATISTICS; THEORETICAL STUDY;

EID: 0017368046     PISSN: 00189472     EISSN: 21682909     Source Type: Journal    
DOI: 10.1109/TSMC.1977.4309803     Document Type: Article

References (5)

1. J.D. Elashoff, R.M. Elashoff, and G.E. Goldman, “On the choice of variables in classification problems with dichotomous variables”, Biometrika, vol. 54, pp. 668–670, 1967.
2. G.T. Toussaint, “Note on the optimal selection of independent binary-valued features for pattern recognition,” IEEE Trans. Information Theory, vol. IT-17, p. 618, Sept. 1971.
3. T.M. Cover, “The best two independent measurements are not the two best,” IEEE Trans. Systems, Man, and Cybernetics, vol. SMC-4, no. 1, pp. 116–117, Jan. 1974.
4. A.N. Mucciardi and E.E. Gose, “A comparison of seven techniques for choosing subsets of pattern recognition properties,” IEEE Trans. Computers, vol. C-20, pp. 1023–1031, Sept. 1971.
5. S.D. Stearns, “On selecting features for pattern classifiers,” in Proc. Third Int. Joint Conf. Pattern Recognition, Coronado, CA, Nov. 1976, IEEE Computer Society, pp. 71–75.