SOURCE - DRAIN BURN-OUT IN GaAs MESFETs.

Inst Phys Conf Ser

Volumn , Issue 33 b, 1976, Pages 262-270

  Wemple, S H ^a   Niehaus, W C ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

TRANSISTORS, FIELD EFFECT;

EID: 0017316336     PISSN: None     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

References (3)