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Volumn 63, Issue C, 1976, Pages 482-486
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Implantation profiles and sputtering studied by detecting the optical radiation from sputtered particles during ion bombardment
a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM AND ALLOYS - RADIATION EFFECTS;
SILICON AND ALLOYS - RADIATION EFFECTS;
SILVER AND ALLOYS - RADIATION EFFECTS;
VANADIUM AND ALLOYS - RADIATION EFFECTS;
FIRST WALL;
NUCLEAR REACTORS, THERMONUCLEAR;
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EID: 0017291263
PISSN: 00223115
EISSN: None
Source Type: Journal
DOI: 10.1016/0022-3115(76)90370-6 Document Type: Article |
Times cited : (7)
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References (15)
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