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Volumn 63, Issue C, 1976, Pages 482-486

Implantation profiles and sputtering studied by detecting the optical radiation from sputtered particles during ion bombardment

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM AND ALLOYS - RADIATION EFFECTS; SILICON AND ALLOYS - RADIATION EFFECTS; SILVER AND ALLOYS - RADIATION EFFECTS; VANADIUM AND ALLOYS - RADIATION EFFECTS;

EID: 0017291263     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-3115(76)90370-6     Document Type: Article
Times cited : (7)

References (15)
  • 7
    • 84915502421 scopus 로고    scopus 로고
    • K.B. Winterbon, private communication.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.