New Developments in Defect Studies in Semiconductors

IEEE Transactions on Nuclear Science

Volumn 23, Issue 6, 1976, Pages 1497-1505

  Kimerling, L C ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MICROSCOPIC EXAMINATION; SEMICONDUCTING SILICON - DEFECTS; SEMICONDUCTOR DEVICE TESTING; SPECTROSCOPY;

SEMICONDUCTOR MATERIALS;

EID: 0017244356     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1976.4328529     Document Type: Article

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