Time-Domain Spectroscopy of Dielectric Materials

IEEE Transactions on Instrumentation and Measurement

Volumn IM-25, Issue 4, 1976, Pages 371-375

  Cole, Robert H ^a  

^a BROWN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MICROWAVE MEASUREMENTS - PERMITTIVITY; SPECTROSCOPY, MICROWAVE;

DIELECTRIC MATERIALS;

EID: 0017218721     PISSN: 00189456     EISSN: 15579662     Source Type: Journal    
DOI: 10.1109/TIM.1976.6312244     Document Type: Article

References (9)

1. R. H. Cole, J. Phys. Chem., vol. 79, pp. 93 and 1469, 1975.
2. For reviews of various methods, see the articles by A. Suggett in Dielectric and Related Molecular Processes, vol. 7. London, England: The Chemical Society, 1972, p. 100; and M. J. C. van Gemert, Philips Res. Rep., vol. 28, p. 5 1973. ‘
3. R. H. Cole, J. Phys. Chem., vol. 78, p. 1440, 1974; vol. 79, p. 1459, 1975.
4. J. W. Cooley and J. W. Tukey, Math. Comput., vol. 19, p. 297, 1965.
5. W. L. Gans and J. R. Andrews, “Time domain automatic network analyzer,” Nat. Bur. Stand., Boulder, CO, Tech Note 672, 176 pp., 1975.
6. H. Fellner-Feldegg, J. Phys. Che vol. 76, p. 2116, 1972.
7. K. Giese and R. Tiemann, Adv. Mol. Relax. Processes, vol. 7, p. 45, 1975.
8. M. F. Iskander and S. S. Stuchly, IEEE Trans. Instrum. Meas., vol. IM-21, p. 425, 1972.
9. M. J. C. van Gemert, Adv. Mol. Relax Processes, vol. 6, p. 123, 1974.