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Volumn 47, Issue 10, 1976, Pages 4574-4577
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Determination of interface and bulk-trap states of IGFET's using deep-level transient spectroscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
TRANSISTORS, FIELD EFFECT;
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EID: 0017005446
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.322381 Document Type: Article |
Times cited : (62)
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References (19)
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