메뉴 건너뛰기




Volumn 47, Issue 10, 1976, Pages 4574-4577

Determination of interface and bulk-trap states of IGFET's using deep-level transient spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

TRANSISTORS, FIELD EFFECT;

EID: 0017005446     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.322381     Document Type: Article
Times cited : (62)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.