Second Breakdown in Power Transistors Due to Avalanche Injection

IEEE Transactions on Electron Devices

Volumn 23, Issue 8, 1976, Pages 851-857

  Beatty, Brent A ^a   Krishna, Surinder ^a   Alder, Michael S ^a  

^a GE GLOBAL RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

TRANSISTORS, BIPOLAR;

EID: 0016988719     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1976.18498     Document Type: Article

References (19)

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