Thermal Characterization of Power Transistors

IEEE Transactions on Electron Devices

Volumn 23, Issue 8, 1976, Pages 831-838

  Oettinger, Frank F ^a   Blackburn, David L ^a   Rubin, Sherwin ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

THERMAL VARIABLES MEASUREMENT;

TRANSISTORS;

EID: 0016986882     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1976.18495     Document Type: Article

References (24)

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