Some Aspects of GaAs MESFET Reliability

IEEE Transactions on Microwave Theory and Techniques

Volumn 24, Issue 6, 1976, Pages 317-321

  Abbott, David A ^a   Turner, James A ^a  

^a Plessey Company plc   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE ANALYSIS; MICROWAVE DEVICES - RELIABILITY;

TRANSISTORS, FIELD EFFECT;

EID: 0016962780     PISSN: 00189480     EISSN: 15579670     Source Type: Journal    
DOI: 10.1109/TMTT.1976.1128849     Document Type: Article

References (18)

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