Zener and Avalanche Breakdown in As-Implanted Low-Voltage Si n-p Junctions

IEEE Transactions on Electron Devices

Volumn 23, Issue 5, 1976, Pages 512-518

  Fair, Richard B ^a   Wivell, Hayden W ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC BREAKDOWN;

SEMICONDUCTOR DEVICES;

EID: 0016950077     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1976.18438     Document Type: Article

References (27)

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