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Volumn 47, Issue 4, 1976, Pages 1203-1208
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Electromigration in thin aluminum films on titanium nitride
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Author keywords
[No Author keywords available]
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Indexed keywords
SEMICONDUCTOR DEVICES;
ALUMINUM AND ALLOYS;
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EID: 0016940795
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.322842 Document Type: Article |
Times cited : (1062)
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References (18)
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