Breakdown mechanisms and electrical properties of triggered vacuum gaps

Journal of Applied Physics

Volumn 47, Issue 4, 1976, Pages 1310-1317

  Govinda Raju, G R ^a   Hackam, R ^a   Benson, F A ^a  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

TRIGGERED VACUUM GAPS;

ELECTRIC DISCHARGES;

EID: 0016939816     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.322832     Document Type: Article

References (11)