Laser wavelength comparison by high resolution interferometry

Applied Optics

Volumn 15, Issue 3, 1976, Pages 734-743

  Layer, H P ^a   Deslattes, R D ^a   Schweitzer, W G ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LASERS, GAS;

EID: 0016931916     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.15.000734     Document Type: Article

References (39)

1. R. L. Barger and J. L. Hall, Phys. Rev. Lett. 22, 4 (1969).
2. R. L. Barger and J. L. Hall, Appl. Phys. Lett. 22, 196 (1973).
3. S. N. Bagaev, E. V. Baklanov, E. A. Titov, and V. P. Chebotayev, JETP Lett. 20, 130 (1974).
4. A. Brillet, P. Cerez, and H. Clergest, IEEE J. Quantum Electron. QE-10, 526 (1974).
5. J. L. Hall, in Proceedings of the Fifth International Conference on Atomic Masses and Fundamental Constants, Paris, France (June 1975) (to be published).
6. B. W. Jolliffe, K. C. Shotton, and P. T. Woods, in Proceedings of the Fifth International Conference on Atomic Masses and Fundamental Constants, Paris, France (June 1975) (to be published).
7. A. Brillet, P. Cerez, S. Hajdukovic, and F. Hartman, in Proceedings of the Fifth International Conference on Atomic Masses and Fundamental Constants, Paris, France (June 1975) (to be published).
8. G. R. Hanes, K. M. Baird, and J. DeRemigis, Appl. Opt. 12, 1600 (1973).
9. W. R. C. Rowley and A. J. Wallard, J. Phys. E6, 647 (1973).
10. J. D. Knox and Y. H. Pao, Appl. Phys. Lett. 18, 360 (1971).
11. W. G. Schweitzer, Jr., E. G. Kessler, Jr., R. D. Deslattes, H. P. Layer, and J. R. Whetstone, Appl. Opt. 12, 2927 (1973).
12. J. Helmcke and F. Bayer-Helms, Metrologia 10, 69 (1974).
13. J. B. Cole and C. F. Bruce, Appl. Opt. 14, 1303 (1975).
14. A. J. Wallard, in Proceedings of the Fifth International Conference on Atomic Masses and Fundamental Constants, Paris, France (June 1975) (to be published).
15. J. Helmcke, in Proceedings of the Fifth International Conference on Atomic Masses and Fundamental Constants, Paris, France (June 1975) (to be published).
16. e Ser. 41, 15 (1973) contains the CCDM recommendations regarding the definition of the meter and the speed of light. These recommendations were recently adopted by the General Conference of Weights and Measures (CGPM) cf, Proceedings of the 15th General Conference on Weights and Measures, Paris (May 1975), Resolutions A and B, to be published (Bureau International des Poids et Mesures, Pavillon de Breteuil, F-92310, Sevres, France). See also J. Terrien, Metrologia 10, 75 (1974).
17. A. J. Wallard, J. M. Chartier, and J. Hamon, Metrologia 11, 89 (1975).
18. K. M. Baird, D. S. Smith, and W. E. Berger, Opt. Commun. 7, 107 (1973).
19. K. M. Evenson, J. S. Wells, F. R. Peterson, B. L. Danielson, and G. W. Day, Appl. Phys. Lett. 30, 1101 (1973).
20. H. Kogelnik and T. Li, Proc. IEEE 54, 1312 (1966).
21. Z. Bay, G. G. Luther, and J. A. White, Phys. Rev. Lett. 29, 189 (1972).
22. I. P. Kaminow and E. H. Turner, Proc. IEEE 54, 1374 (1966).
23. 2.
24. T. J. Bridges and J. W. Kluver, Appl. Opt. 4, 1121 (1965).
25. D. Hentz, in Proceedings, 18th Conference on Magnetism and Magnetic Materials, H. C. Wolfe, Ed. (American Institute of Physics, New York, 1973), p. 954.
26. H. Kuhn and B. A. Wilson, Proc. Phys. Soc. London, Sect. B. 63, 745 (1950).
27. J. M. Bennett, J. L. Stanford, and E. J. Ashley, J. Opt. Soc. Am. 60, 224 (1970).
28. D. K. Burge, H. E. Bennett, and E. J. Ashley, Appl. Opt. 12,42 (1973).
29. It should be possilbe to measure the radius of curvature of interferometer mirrors to the necessary precision by using a variation of this measurement. Equation (3) becomes very simple if one optical frequency is derived from the other optical frequency by doubling, for example, in a nonlinear crystal; the Fresnel phase shift difference is expressed in terms of the frequency offset terms. This method has the advantage that the radius of the central area of the mirrors is measured, the area relevant to subsequent frequency ratio measurement, and reduces the importance of using several mirrors to assess the error introduced by incomplete mirror characterization.
30. K. M. Evenson, J. S. Wells, F. R. Peterson, B. L. Danielson, G. W. Day, R. L. Barger, and J. L. Hall, Phys. Rev. Lett. 29, 1346 (1972).
31. A. Marchel, J. Opt. Soc. Am. 51, 396 (1961).
32. J. Simon, Appl. Opt. 9, 2337 (1970).
33. R. Philip and J. Trompette, C. R. Acad. Sci. Paris 241, 627 (1955).
34. L. G. Schulz and F. R. Tangherlini, J. Opt. Soc. Am. 44, 362 (1954).
35. L. G. Schulz, J. Opt. Soc. Am. 44, 362 (1959).
36. K. Weiss, Z. Naturforsch. Teil A 3, 143 (1948).
37. J. R. Beattie, Physica 23, 898 (1957).
38. I. N. Shkliqrevskii and V. G. Padalka, Opt. Specktrosk. 6, 78 (1959) [Opt. Spectrosc. 6, 45 (1959)].
39. G. Hass, J. Opt. Soc. Am. 45, 945 (1955).