메뉴 건너뛰기




Volumn 47, Issue 3, 1976, Pages 1082-1089

Hole traps in silicon dioxide

Author keywords

[No Author keywords available]

Indexed keywords

SILICA - THIN FILMS;

EID: 0016931911     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.322730     Document Type: Article
Times cited : (104)

References (31)
  • 24
    • 84918022657 scopus 로고
    • Proceedings of the 10th Reliability Physics Symposium
    • (unpublished).
    • (1972) , pp. 120
    • Woods, M.H.1    Tuska, J.W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.