|
Volumn 47, Issue 3, 1976, Pages 1196-1198
|
Electron trapping by radiation-induced charge in MOS devices
|
Author keywords
[No Author keywords available]
|
Indexed keywords
MOS DEVICES;
SEMICONDUCTOR DEVICES, MIS;
|
EID: 0016931014
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.322706 Document Type: Article |
Times cited : (122)
|
References (16)
|