The effect of radiation damage on the noise performance of fet's

IEEE Transactions on Nuclear Science

Volumn 22, Issue 6, 1975, Pages 2696-2702

  Chiwaki, M ^a   Tomimasu, T ^a  

^a ELECTROTECHNICAL LABORATORY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

RADIATION DETECTORS; TRANSISTORS - RADIATION DAMAGE;

TRANSISTORS, FIELD EFFECT;

EID: 0016673932     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1975.4328192     Document Type: Article

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