Frequency response of the current multiplication process in MIS tunnel diodes

Solid State Electronics

Volumn 18, Issue 9, 1975, Pages 745-752

  Green, M A ^a   Temple, V A K ^a   Shewchun, J ^a  

^a MCMASTER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR DEVICES, MIS;

SEMICONDUCTOR DIODES, TUNNEL;

EID: 0016546027     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/0038-1101(75)90151-3     Document Type: Article

References (11)

1. Direct Measurement of the Valley-Orbit Splitting of Shallow Donors in Silicon
2. Effects of Certain Chemical Treatments and Ambient Atmospheres on Surface Properties of Silicon
3. The mechanism of self-healing electrical breakdown in MOS structures