Electromigration in thin gold films on molybdenum surfaces

Thin Solid Films

Volumn 25, Issue 2, 1975, Pages 327-334

  Blech, I A ^a   Kinsbron, E ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMIGRATION;

GOLD AND ALLOYS;

EID: 0016473653     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(75)90052-8     Document Type: Article

References (12)

1. Electromigration and failure in electronics: An introduction
2. Electromigration—A brief survey and some recent results