The Boolean Difference and Multiple Fault Analysis

IEEE Transactions on Computers

Volumn C-24, Issue 1, 1975, Pages 62-71

  Ku, Chia Tai ^a   Masson, Gerald M ^a  

^a UNIVERSITY OF PITTSBURGH   (United States)

Author keywords

Boolean difference; combinational logic circuits; complete test set; minimal test set; multiple fault analysis

Indexed keywords

FAULT DIAGNOSIS;

LOGIC CIRCUITS, COMBINATORIAL;

EID: 0016439298     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/T-C.1975.224083     Document Type: Article

References (9)

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