Measurement of White and 1/ f Noise within Burst Noise

Proceedings of the IEEE

Volumn 62, Issue 12, 1974, Pages 1711-1713

  Strasilla, Udo J ^a   Strutt, Max J O ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

BURST NOISE; NOISE POWER SPECTRA;

SPECTRUM ANALYSIS - ELECTRIC WAVEFORMS;

SEMICONDUCTOR DEVICES;

EID: 0016343488     PISSN: 00189219     EISSN: 15582256     Source Type: Journal    
DOI: 10.1109/PROC.1974.9691     Document Type: Article

References (6)

1. S. T. Hsu, R. J. Whittier, and C. A. Mead, “Physical model for burst noise in semiconductor devices,” Solid-State Electron., vol. 13, 1055-1071, July 1970.
2. K. B. Cook, Jr., Burst noise in bipolar junction transistors, Ph.D. dissertation, Univ. Florida, Gainesville, 1970.
3. J. N. Puckett, Jr., An electrical and statistical study of burst noise, Ph.D. dissertation, California Inst. Technol., Pasadena, 1971.
4. M. J. O. Strutt, Semiconductor Devices. New York: Academic Press, 1966, 238-277.
5. U. J. Strasilla, Various types of noise in monolithic integrated operational amplifiers, Ph.D. dissertation, Swi ss Federal Inst. Technol., Zurich, Switzerland, 1973.
6. U. J. Stradlla and M. J. O. Strutt, “Narrow-band variance noise,” J. Appl. Phys., vol. 45, pp. 1423-1428, Mar. 1974.