DIELECTRIC INSTABILITY AND BREAKDOWN IN WIDE BANDGAP INSULATORS.

J Vac Sci Technol

Volumn 12, Issue 1, 1974, Pages 37-46

  DiStefano, T H ^a   Shatzkes, M ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON DEVICE TESTING - THIN FILMS;

ELECTRIC INSULATORS;

EID: 0016006161     PISSN: None     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

References (32)