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Volumn 27, Issue 1, 1974, Pages 43-46
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ACCURATE MEASUREMENT OF COMPLEX PERMITTIVITY OF LOW-LOSS MIC SUBSTRATE SLABS.
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NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
INTEGRATED CIRCUITS;
MICROWAVE DEVICES;
MIC;
MICROWAVE INTEGRATED CIRCUITS;
ELECTRIC MEASUREMENTS;
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EID: 0015961092
PISSN: None
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
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Times cited : (2)
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References (10)
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