TEST POINT PLACEMENT TO SIMPLIFY FAULT DETECTION.

Volumn , Issue , 1973, Pages 73-78

  Hayes, J P ^a   Friedman, Arthur D ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER PROGRAMMING - RELIABILITY;

FAULT DETECTION;

LOGIC CIRCUITS;

EID: 0015752131     PISSN: None     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

References (5)