메뉴 건너뛰기




Volumn C-22, Issue 11, 1973, Pages 1016-1020

Complete Test Sets for Logic Functions

Author keywords

Complete test sets; expanded truth table; fault detect; ing test sets; logic networks; multiple stuck at faults; restricted gate networks; stuck at faults; unate gate networks

Indexed keywords

LOGIC CIRCUITS;

EID: 0015681902     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/T-C.1973.223638     Document Type: Article
Times cited : (59)

References (8)
  • 1
    • 0015161270 scopus 로고
    • Derivation of minimum test sets for unate logical circuits
    • Nov.
    • R. Betancourt, “Derivation of minimum test sets for unate logical circuits,” IEEE Trans. Comput., vol. C-20, pp. 1264–1269, Nov. 1971.
    • (1971) IEEE Trans. Comput. , vol.C-20 , pp. 1264-1269
    • Betancourt, R.1
  • 2
    • 2342587244 scopus 로고
    • Fault detection in redundant circuits
    • Feb.
    • A. D. Friedman, “Fault detection in redundant circuits,” IEEE Trans. Electron. Comput., vol. EC-16, pp. 99–100, Feb. 1967.
    • (1967) IEEE Trans. Electron. Comput. , vol.EC-16 , pp. 99-100
    • Friedman, A.D.1
  • 3
    • 0015434912 scopus 로고
    • Easily testable realizations for logic functions
    • Nov.
    • S. M. Reddy, “Easily testable realizations for logic functions,” IEEE Trans. Comput., vol. C-21, pp. 1183–1188, Nov. 1972.
    • (1972) IEEE Trans. Comput. , vol.C-21 , pp. 1183-1188
    • Reddy, S.M.1
  • 4
    • 0015482086 scopus 로고
    • A design procedure for fault-locatable switching circuits
    • Dec.
    • ――, “A design procedure for fault-locatable switching circuits,” IEEE Trans. Comput., vol. C-21, pp. 1421–1426, Dec. 1972.
    • (1972) IEEE Trans. Comput. , vol.C-21 , pp. 1421-1426
  • 5
    • 34548043422 scopus 로고
    • Unate cellular logic
    • Feb.
    • A. Mukhopadhyay, “Unate cellular logic,” IEEE Trans. Comput., vol. C-18, pp. 114–121, Feb. 1969.
    • (1969) IEEE Trans. Comput. , vol.C-18 , pp. 114-121
    • Mukhopadhyay, A.1
  • 6
    • 0015161114 scopus 로고
    • Cause-effect analysis of multiple fault detection in combinational network
    • Nov.
    • D. C. Bossen and S. S. Hong, “Cause-effect analysis of multiple fault detection in combinational network,” IEEE Trans. Comput., vol. C-20, pp. 1252–1258, Nov. 1971.
    • (1971) IEEE Trans. Comput. , vol.C-20 , pp. 1252-1258
    • Bossen, D.C.1    Hong, S.S.2
  • 7
    • 84939065301 scopus 로고
    • An algebraic approach to fault detection
    • presented at the 2nd Workshop on Fault Detection and Diagnosis in Digital System, Lehigh Univ., Bethlehem, Pa., Dec.
    • A. R. Klayton and A. K. Susskind, “An algebraic approach to fault detection,” presented at the 2nd Workshop on Fault Detection and Diagnosis in Digital System, Lehigh Univ., Bethlehem, Pa., Dec. 1971.
    • (1971)
    • Klayton, A.R.1    Susskind, A.K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.