![]() |
Volumn C-22, Issue 11, 1973, Pages 1016-1020
|
Complete Test Sets for Logic Functions
|
Author keywords
Complete test sets; expanded truth table; fault detect; ing test sets; logic networks; multiple stuck at faults; restricted gate networks; stuck at faults; unate gate networks
|
Indexed keywords
LOGIC CIRCUITS;
|
EID: 0015681902
PISSN: 00189340
EISSN: None
Source Type: Journal
DOI: 10.1109/T-C.1973.223638 Document Type: Article |
Times cited : (59)
|
References (8)
|