Universal Test Sets for Logic Networks

IEEE Transactions on Computers

Volumn C-22, Issue 9, 1973, Pages 835-839

  Akers, Sheldon B ^a  

^a GENERAL ELECTRIC COMPANY   (United States)

Author keywords

Fault detection; functional testing; multiple faults; single faults; stuck at faults; universal test sets

Indexed keywords

FAULT DETECTION; MICROELECTRONICS;

LOGIC CIRCUITS, NAND;

EID: 0015663187     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/TC.1973.5009174     Document Type: Article

References (9)

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