Electron back-scattering patterns—a new technique for obtaining crystallographic information in the scanning electron microscope

Philosophical Magazine

Volumn 27, Issue 5, 1973, Pages 1193-1200

  Venables, J A ^a   Harland, C J ^a  

^a UNIVERSITY OF SUSSEX   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

METALLOGRAPHY; MICROSCOPIC EXAMINATION;

ELECTRON MICROSCOPY;

CRYSTALLOGRAPHY;

EID: 0015627883     PISSN: 00318086     EISSN: None     Source Type: Journal    
DOI: 10.1080/14786437308225827     Document Type: Article

References (11)

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3. Cort, D. M., and Steeds, J. W., 1972, Phys. Stat. Sol. A, 10,215.
4. van Essen, C. G., 1970, 7th International Conqress for Electron Microscopy, Grenoble, 1,237.
5. van Essen, C. G., Schulson, E. M., and Donaghay, R. H., 1970, Nature, Lond., 225,847.
6. Hirsch, P. B., and Humphreys, C. J., 1970, Scanning Electron Microscopy, Chicago, p. 449.
7. Howie, A., 1972, Proc. 5th Eur. Reg. Conf. for Electron Microscopy, Manchester, p. 408.
8. Joy, D. C., and Booker, G. R., 1971, J. Phys. E, 4,837.
9. Joy, D. C., Booker, G. R., Fearson, E. O., and Bevis, M., 1971, Scanning Electron Microscopy, 1971, Chicago, p. 497.
10. Joy, D. C., and Newbury, D. E., 1972, J. mater. Sci., 7, 714.
11. Schulson, E. M., and van Essen, C. G., 1969, J. Phys. E, 2,247.