Indices of refraction of ZnS, ZnSe, ZnTe, CdS, and CdTe in the far infrared

Optics Communications

Volumn 7, Issue 3, 1973, Pages 229-232

  Hattori, T ^a   Homma, Y ^a   Mitsuishi, A ^a   Tacke, M ^b  

^a OSAKA UNIVERSITY   (Japan)

^b UNIVERSITY OF FREIBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL VARIABLES MEASUREMENT;

EID: 0015600526     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/0030-4018(73)90015-1     Document Type: Article

References (18)

1. Spectral Properties and Tunability of Far-Infrared Difference-Frequency Radiation Produced by Picosecond Laser Pulses
2. Far Infrared Measurement of the Dielectric Properties of GaAs and CdTe at 300 K and 8 K
3. Michelson-Type Fourier Spectrometer for the Far Infrared
4. Infrared Lattice Reflection Spectra of II-VI Compounds
5. Second-order Raman spectrum of ZnSe
6. Some Optical Properties of Group II–VI Semiconductors (II)
7. Electroelastic Properties of the Sulfides, Selenides, and Tellurides of Zinc and Cadmium