ON THE FORMATION OF SURFACE STATES DURING STRESS AGING OF THERMAL Si-SiO2 INTERFACES.

Journal of the Electrochemical Society

Volumn 120, Issue 1, 1973, Pages 90-96

  Goetzberger, A ^a   Lopez, A D ^a   Strain, R J ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR MATERIALS - TESTING;

ELECTRON INSULATORS;

SEMICONDUCTING SILICON;

EID: 0015558424     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.2403408     Document Type: Article

References (26)