Refractive indices and electro-optic coefficients of the eulitities Bi 4Ge3O12 and Bi4Si3O 12

Journal of Applied Physics

Volumn 43, Issue 12, 1972, Pages 5110-5111

  Bortfeld, D P ^a   Meier, H ^a  

^a RCA Laboratories   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROOPTICAL EFFECTS;

CRYSTALS;

EID: 0015474721     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1661080     Document Type: Article

References (13)