Application of Optimum Error-Reject Functions

IEEE Transactions on Information Theory

Volumn 18, Issue 6, 1972, Pages 814-817

  Fukunaga, Keinosuke ^a   Kessell, David L ^b  

^a PURDUE UNIVERSITY   (United States)

^b LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PATTERN RECOGNITION SYSTEMS;

EID: 0015433515     PISSN: 00189448     EISSN: 15579654     Source Type: Journal    
DOI: 10.1109/TIT.1972.1054919     Document Type: Article

References (10)

1. C. K. Chow, “On optimum recognition error and reject tradeoff,” IEEE T'rans. Inform Theory, vol IT-16, pp. 41-46. Jan. 1970.
2. K. Fukunaga and D. L. Kessel, “Estimation of classification error,” IEEE Trans. Computers, vol. C-20, pp. 1521–1527, Dec. 1971.
3. K. Fukunaga, Introduction to Statistical Pattern Recognition. New York: Academic Press, 1972, ch. 5.
4. R. V. Hogg and A. T. Craig, Introduction to Mathematical Statistics. New York: MacMillan, 1969, p. 301.
5. G. E. Noether, Elements of Non-Parametric Statistics. New York: Wiley, 1967, ch. 4.
6. M. Okamoto, “An asymptotic expansion for the distribution of the linear discriminant function,” Ann. Math. Statist., vol. 34, pp. 1286–1301, 1963.
7. —, “Correction to ‘An asymptotic expansion for the distribution of the linear dicriminant function’,” ibid., vol. 39, p. 135, 1968.
8. S. E. Estes, “Measurement selection for linear discriminants used in pattern classification,” IBM Res. Rep. RJ-331, Apr. 1965
9. T. Marill and D. M Green, “On the effectiveness of receptors in recognition systems,” IEEE Trans, Inform. Theory, vol. IT -9, pp. 11–17, Jan. 1963.
10. K. Fukunaga and T. F. Krile, “Calculation of Bayes recognition error for two multivariate Gaussian distributions,” IEEE Trans. Comput., vol. C-18, pp. 220–229, Mar. 1969.