SCOPUS 정보 검색 플랫폼

Volumn 43, Issue 11, 1972, Pages 4385-4390

Investigation of film-thickness determination by oscillating quartz resonators with large mass load

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC RESONATORS; THICKNESS MEASUREMENT;

QUARTZ-CRYSTAL RESONATORS;

FILMS;

EID: 0015433480 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.1660931 Document Type: Article

Times cited : (345)

References (10)

2
- 0039510155
- edited by K. Behrndt (Plenum, New York)
- (1966) Vacuum Microbalance Techniques , vol.5 , pp. 193
- Stockbridge, C.D.¹

5
- 0003750336
- (Chemical Catalog Company, Inc., New York)
- (1927) The Properties of Silica
- Sosman, R.B.¹

7
- 0000283861
- (1968) J. Appl. Phys. , vol.39 , pp. 5815
- Miller, J.G.¹ Bolef, D.I.²

8
- 0000879026
- (1968) J. Appl. Phys. , vol.39 , pp. 4589
- Miller, J.G.¹ Bolef, D.I.²

9
- 33747534450
- edited by S. P. Wolsky and E. J. Zadnauk (Interscience, New York)
- (1969) Ultra Micro Weight Determination in Controlled Environments , pp. 137
- Warner, A.W.¹

10
- 0003428285
- (McGraw-Hill, New York)
- (1963) American Institute of Physics Handbook, 2nd ed. , pp. 3

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.