Considerations of Sample and Feature Size

IEEE Transactions on Information Theory

Volumn 18, Issue 5, 1972, Pages 618-626

  Foley, Donald H ^a  

^a Pattern Analysis and Recognition Inc ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PATTERN RECOGNITION SYSTEMS;

EID: 0015395891     PISSN: 00189448     EISSN: 15579654     Source Type: Journal    
DOI: 10.1109/TIT.1972.1054863     Document Type: Article

References (17)

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5. G.F. Hughes On the mean accuracy of statistical pattern recognizers IEEE Trans. Inform. Theory IT-14 5 63 Jan 1968
6. K. Abend T.J. Harley B. Chandrasekaran Comments on the mean accuracy of statistical pattern recognizers IEEE Trans. Inform. Theory IT-IS 420 423 May 1969
7. J.R. Ullmann Experiments with the n-tuple method of pattern recognition IEEE Trans. Comput (Short Notes). C-18 1135 1137 Dec 1969
8. M. Hills Allocation rules and their error rates J. Roy. Staiist. Soc., ser. B 28 1966
9. P.A. Lachenbruch M.R. Mickey Estimation of error rates in discriminant analysis Technometrics 10 1 Feb 1968
10. P.A. Lachenbruch Estimation of error rates in discriminant analysis Ph.Dp. dissertation Univ. Southern California, Los Angeles 1965
11. K. Fukunaga D.L. Kessell Estimation of classification errors,” in Proc IEEE Symp. Adaptive Processes, Dec 1970
12. T.M. Cover Geometrical and statistical properties of linear inequalities with applications in pattern recognition IEEE Trans. Electron. Comput. EC-14 326 334 June 1965
13. L. Kanal B. Chandrasekaran On dimensionality and sample size in statistical pattern classification,” in Proc 2 7 National Electronics Conf 1968
14. J.W. Sammon Jr. An optimal discriminant plane IEEE Trans. Comput. (Short Notes) C-19 826 829 Sept 1970
15. Interactive pattern analysis and classification IEEE Trans. Comput. C-19 594 616 July 1970
16. P.G. Hoel R.P. Peterson A solution to the problem of optimum allocation Ann. Math. Statist., pp 20 433 438 1949
17. D.H. Foley The probability of error on the design set as a function of the sample size and feature size Ph.D. dissertation, Syracuse Univ., Syracuse, N.Y. 71 171 June; also RADC-TR- 1971