Lower critical field measurements in NbN bulk and thin films

Journal of Applied Physics

Volumn 43, Issue 7, 1972, Pages 3158-3161

  Mathur, M P ^a   Deis, D W ^a   Gavaler, J R ^a  

^a Westinghouse Research & Development Cent   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FILMS - SUPERCONDUCTING;

SUPERCONDUCTING FILMS;

SUPERCONDUCTING MATERIALS;

EID: 0015361028     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1661678     Document Type: Article

References (11)

1. Princeton Applied Research model 155.