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Volumn 11, Issue 2, 1972, Pages 783-786

Investigation of thermal oxide films of silicon by infrared absorption

Author keywords

[No Author keywords available]

Indexed keywords

SPECTROSCOPY, INFRARED;

EID: 0015356603     PISSN: 00318965     EISSN: 1521396X     Source Type: Journal    
DOI: 10.1002/pssa.2210110244     Document Type: Article
Times cited : (11)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.