Fourier descriptors for plane closed curves

IEEE Transactions on Computers

Volumn C-21, Issue 3, 1972, Pages 269-281

  Zahn, Charles T ^a,b   Roskies, Ralph Z ^b  

^a SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^b YALE UNIVERSITY   (United States)

Author keywords

Boundary functions; curvature functions; features; form invariant; Fourier descriptors; image processing; intrinsic functions; pattern analysis; pattern recognition; pattern symmetry; pattern synthesis; planar curves; shape description

Indexed keywords

PATTERN RECOGNITION SYSTEMS;

EID: 0015315797     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/TC.1972.5008949     Document Type: Article

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