Multiple Fault Detection in Combinational Networks

IEEE Transactions on Computers

Volumn C-21, Issue 1, 1972, Pages 31-36

  Gault, James W ^a   Robinson, John P ^b   Reddy, Sudhakar M ^b  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

^b UNIVERSITY OF IOWA   (United States)

Author keywords

Combinational networks; multiple faults; self diagnosis; testing

Indexed keywords

COMBINATIONAL CIRCUITS; FAULT TOLERANT MACHINES; SWITCHING THEORY;

AUTOMATA THEORY;

EID: 0015284302     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/T-C.1972.223428     Document Type: Article

References (3)

1. A. D. Friedman, “Fault detection in redundant circuits,” IEEE Trans. Electron. Comput. (Short Notes), vol. EC-16, pp. 99–100, Feb. 1967.
2. J. F. Poage, “Derivation of optimal tests to detect faults in combination circuits.” in Mathematical Theory of Automata. Brooklyn, N. Y.: Polytechnic Press, pp. 483–528.
3. D. R. Schertz and G. A. Metze, “On the indistinguishability of faults in digital systems,” in Proc. 6th Annu. Allerton Conf. Circuit and System Theory, 1968, pp. 752–760.