Thermal Properties of Very Fast Transistors

IEEE Transactions on Electron Devices

Volumn 17, Issue 8, 1970, Pages 586-594

  Joy, Richard C ^a   Schlig, E S ^b  

^a IBM   (United States)

^b IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IETDA;

EID: 0014834628     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1970.17035     Document Type: Article

References (7)

1. R. W. Keyes, “Physical problems and limits in computer logic,” IEEE Spectrum, pp. 36-45, May 1969.
2. R. Holm, Electrical Contacts Handbook. Berlin: Springer-Verlag, 1958
3. H. S. Carslaw and J. C. Jaeger, Conduction of Heat in Solids, 2nd ed. Oxford: Oxford University Press, 1962.
4. J. J. Sparkes, “Voltage feedback and thermal resistance in junction transistors,” Proc. IRE, vol. 46, pp. 1305-1306, June 1958.
5. E. S. Schlig, “Low-temperature operation of Ge picosecond logic circuits,” IEEE J. Solid-State Circuits, vol. SC-3, pp. 271-276, September 1968.
6. F. H. Dill, A. S. Farber, and H. N. Yu, “Picosecond integrated circuits in germanium and silicon,” IEEE J. Solid-State Circuits, vol. SC-3, pp. 160-162, June 1968.
7. J. A. Carruthers, T. H. Geballe, H. M. Rosenberg, and J. M. Ziman, “The thermal conductivity of germanium and silicon between 2 and 300°K,” Proc. Roy. Soc., vol. A238, pp. 502-514, January 1957.