Counting and sizing of submicron particles by the resistive pulse technique

Review of Scientific Instruments

Volumn 41, Issue 7, 1970, Pages 909-916

  DeBlois, R W ^a   Bean, C P ^a  

^a GE GLOBAL RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COULTER COUNTER; COUNTERS, ACCESSORIES; ELECTROLYTES; PARTICLE SIZE ANALYZERS; RSINA;

EID: 0014813247     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1684724     Document Type: Article

References (17)

1. U.S. Patent No. 2,656,508, issued 20 Oct.
2. Ref. 6
3. More recently we have found that a mixture of Triton X‐155 (Rohm and Hass, Philadelphia 5, Pa.) and Surfynol TG (Airco Chemical, New York, N.Y.) nearly eliminates the plugging problem for the polystyrene spheres.
4. The spheres shown as 0.121 μ were labeled as 0.126 μ, which would correspond to the small datum point at [formula omitted] and 0.0397 MΩ. Since this is off the curve for the other data, these spheres were compared by electron microscopy with those labeled as 0.109 μ diam and were corrected to 0.121 μ on the assumption that the value 0.109 μ was correct.
5. For example
6. For example