Avalanche Injection and Second Breakdown in Transistors

IEEE Transactions on Electron Devices

Volumn 17, Issue 4, 1970, Pages 320-335

  Hower, Philip L ^a   Reddi, V Gopala Krishna ^a  

^a FAIRCHILD SEMICONDUCTOR   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

E D; SEMICONDUCTOR DEVICES, DIODE; TRANSISTOR BREAKDOWN;

EID: 0014766404     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1970.16976     Document Type: Article

References (23)

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