Charge Coupled Semiconductor Devices

Bell System Technical Journal

Volumn 49, Issue 4, 1970, Pages 587-593

  Boyle, W S ^a   Smith, G E ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; REN; SEMICONDUCTOR DEVICES;

EID: 0014764318     PISSN: 00058580     EISSN: 15387305     Source Type: Journal    
DOI: 10.1002/j.1538-7305.1970.tb01790.x     Document Type: Article

References (6)

1. “On the Determination of Minority Carrier Lifetime from the Transient Response of an MOS Capacitor,”
2. “Minority Carrier Lifetime Determination from Inversion Layer Transient Response,”
3. “Influence of Bulk and Surface Properties on Image Sensing Silicon Diode Arrays,”