Diffraction-Pattern Sampling for Automatic Pattern Recognition

Proceedings of the IEEE

Volumn 58, Issue 2, 1970, Pages 198-216

  Lendaris, George G ^a,b   Stanley, Gordon L ^a  

^a GM Research Lab   (United States)

^b OREGON HEALTH AND SCIENCE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAL; LIGHT, DIFFRACTION; PATTERN RECOGNITION SYSTEMS; PHOTOGRAPHY;

EID: 0014700828     PISSN: 00189219     EISSN: 15582256     Source Type: Journal    
DOI: 10.1109/PROC.1970.7593     Document Type: Article

References (9)

1. J. W. Goodman, Introduction to Fourier Optics. San Francisco, Calif.: McGraw-Hill, 1968.
2. M. Born and E. Wolf, Principles of Optics. New York: Pergamon, 1959.
3. F. W. Sears, Optics. Cambridge, Mass.: Addison-Wesley, 1949.
4. G. G. Lendaris and G. L. Stanley, “An opticalogical self-organizing recognition system,” in Optical and Electro-Optical Information Processing. Cambridge, Mass.: M.I.T. Press. 1965, ch. 29.
5. G. G. Lendaris and G. L. Stanley, “Interpreting aerial photography with the GM-DRL pattern recognition system,” General Motors AC-Defense Res. Labs., Santa Barbara, Calif., Tech. Rept. TR65-91, January 1966.
6. G. G. Lendaris and G. L. Stanley, “Applications of diffraction-pattern sampling to automatic target recognition,” General Motors AC-Defense Res. Labs., Santa Barbara, Calif., Tech. Rept. TR67-06, January 1967.
7. “The application of SARF/DPSS to the development of an ATR system,” General Motors AC-Defense Res. Labs., Santa Barbara, Calif. Publ. no. S68-10, July 1968.
8. “SARF, signature analysis research facility,” General Motors AC-Defense Res. Labs., Santa Barbara, Calif., Publ. no. S68-11A, October 1968.
9. G. L. Stanley, W. C. Nienow, and G. G. Lendaris, “SARF, an interactive signature analysis research facility,” General Motors AC-Defense Res. Labs., Santa Barbara, Calif., Tech. Rept. TR69-15, March 1969; also Proc. Purdue University Centennial Year Symp. on Information Processing, 1969.