Electron Probe X-ray Microanalysis for the Assessment of Homogeneity of Candidate Reference Materials at the Nanogram Level

Mikrochimica Acta

Volumn 128, Issue 3, 1998, Pages 207-213

  Hoornaert, Stefaan ^a   Treiger, Boris ^a   Valkovic, Vlado ^a,b,c   Van Grieken, René ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b INTERNATIONAL ATOMIC ENERGY AGENCY   (Austria)

^c A and CT   (Croatia)

Author keywords

Electron probe x ray microanalysis; Homogeneity; Reference materials

Indexed keywords

EID: 0013627905     PISSN: 00263672     EISSN: None     Source Type: Journal    
DOI: 10.1007/bf01243051     Document Type: Article

References (6)

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6. I. Bondarenko, H. Van Malderen, B. Treiger, P. Van Espen, R. Van Grieken, Chemom. Intell. Lab. Syst. 1994, 22, 87.