Evaluation of Reflection Intensities for the Components of Multiple Laue Diffraction Spots by the Maximum-Entropy Method

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 53, Issue 5, 1997, Pages 643-648

  Xie, Y ^a   Hao, Q ^a  

^a DE MONTFORT UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0013507928     PISSN: 01087673     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108767397006429     Document Type: Article

References (26)

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