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Volumn 189, Issue 1, 1998, Pages 83-94
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A Study of the X 2Σ+ and a 2Π States of SiO+ Using Fast-Ion-Beam Laser Spectroscopy
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0013371368
PISSN: 00222852
EISSN: None
Source Type: Journal
DOI: 10.1006/jmsp.1997.7522 Document Type: Article |
Times cited : (28)
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References (16)
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