Single-shot measurement of laser-induced double step ionization of helium

Optics Express

Volumn 10, Issue 26, 2002, Pages 1563-1572

  Kim, K Y ^a   Alexeev, I ^a   Milchberg, H M ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; FOURIER TRANSFORMS; HELIUM; INTERFEROMETRY; LASER DAMAGE; PHASE MEASUREMENT; PLASMAS; SPECTROSCOPIC ANALYSIS; ULTRAFAST PHENOMENA;

DOUBLE STEP IONIZATION; FEMTOSECOND PHENOMENA; SINGLE-SHOT MEASUREMENT; TIME-RESOLVED;

PHOTOIONIZATION;

EID: 0013365920     PISSN: 10944087     EISSN: None     Source Type: Journal    
DOI: 10.1364/OE.10.001563     Document Type: Article

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