Method based on the saturation approach law for monitoring the quality of texture in 3% Si-Fe

Journal of Applied Physics

Volumn 79, Issue 8 PART 2A, 1996, Pages 5202-5204

  Birsan, M ^a   Szpunar, J A ^a  

^a MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0013342768     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.361340     Document Type: Article

References (7)

1. M. Birsan and J. A. Szpunar, J. Appl. Phys. 78, 3293 (1995).
2. H. J. Bunge, Texture Analysis in Materials Science (Butterworths, London, 1982).
3. A. A. Aldenkamp, C. P. Marks, and H. Zijlstra, Rev. Sci. Instrum. 31, 544 (1960).
4. M. Birsan and J. A. Szpunar, Mater. Sci. Forum 157, 1543 (1994).
5. M. Birsan and J. A. Szpunar, J. Appl. Phys. (to be published).
6. W. B. Hutchinson and J. G. Swift, Texture 1, 117 (1972).
7. P. R. Morris and J. W. Flowers, Texture Cryst. Solids 4, 129 (1981).