2-(1-naphthoyl)-5,8-dihydronaphthalen-1-ol

Acta Crystallographica Section C: Crystal Structure Communications

Volumn 54, Issue 6, 1998, Pages 783-785

  Chinnakali, Kandasamy ^a,c   Fun, Hoong Kun ^a   Sriraghavan, Kamaraj ^b   Ramakrishnan, Vayalakkavoor T ^b  

^a SCHOOL OF PHYSICS   (Malaysia)

^b UNIVERSITY OF MADRAS   (India)

^c ANNA UNIVERSITY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0013322180     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S010827019800050X     Document Type: Article

References (9)

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2. Chinnakali, K., Fun, H.-K., Sriraghavan, K. & Ramakrishnan, V. T. (1998). Acta Cryst. C54, 370-371.
3. Crouse, D. J., Hurlbut, S. L. & Wheeler, D. M. S. (1981). J. Org. Chem. 46, 374-378.
4. Hauck, F. P., Cimarusti, C. M. & Sundeen, J. E. (1977). Chem. Abstr. 86, 43447u.
5. Marshall, J. L., Faehl, L. G., McDaniel, C. R. Jr & Ledford, N. D. (1977). J. Am. Chem. Soc. 99, 321-325.
6. Nardelli, M. (1995). J. Appl. Cryst. 28, 659.
7. Sheldrick, G. M. (1990). SHELXTL/PC Users Manual. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
8. Sheldrick, G. M. (1993). SHELXL93. Program for the Refinement of Crystal Structures. University of Göttingen, Germany.
9. Siemens (1994). XSCANS Users Manual. Version 2.1. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.